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Scanning Electron Microscope #167054417
Description
Manchester. England, 06.15.05. Technician using a scanning electron microscope to study metal samples. An electron microscope uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes
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